Determination of the contrast transfer function by analysing diffractograms of thin amorphous foilsKNIPPELMEYER, Rainer; THESING, Andreas; KOHL, Helmut et al.Zeitschrift für Metallkunde. 2003, Vol 94, Num 3, pp 282-289, issn 0044-3093, 8 p.Article

Practical procedure for coma-free alignment using caustic figureKIMOTO, Koji; ISHIZUKA, Kazuo; TANAKA, Nobuo et al.Ultramicroscopy. 2003, Vol 96, Num 2, pp 219-227, issn 0304-3991, 9 p.Article

Selective bond breaking of single iodobenzene molecules with a scanning tunneling microscope tipHLA, Saw-Wai; MEYER, Gerhard; RIEDER, Karl-Heinz et al.Chemical physics letters. 2003, Vol 370, Num 3-4, pp 431-436, issn 0009-2614, 6 p.Article

Sub-ångstrom resolution using aberration corrected electron opticsBATSON, P. E; DELLBY, N; KRIVANEK, O. L et al.Nature (London). 2002, Vol 418, Num 6898, pp 617-620, issn 0028-0836Article

Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiC-based, cross-sectional TEM samplesPREBLE, E. A; MCLEAN, H. A; KIESEL, S. M et al.Ultramicroscopy. 2002, Vol 92, Num 3-4, pp 265-271, issn 0304-3991, 7 p.Article

Coherence and incoherence of inelastically scattered electron wavesFANG ZHOU.Ultramicroscopy. 2002, Vol 92, Num 3-4, pp 293-304, issn 0304-3991, 12 p.Article

High-resolution imaging with an aberration-corrected transmission electron microscopeLENTZEN, M; JAHNEN, B; JIA, C. L et al.Ultramicroscopy. 2002, Vol 92, Num 3-4, pp 233-242, issn 0304-3991, 10 p.Article

Comments on ultra-high-resolution STEMCOWLEY, J. M.Ultramicroscopy. 2001, Vol 87, Num 1-2, pp 1-4, issn 0304-3991Article

Does a monochromator improve the precision in quantitative HRTEM?DEN DEKKER, A. J; VAN AERT, S; VAN DYCK, D et al.Ultramicroscopy. 2001, Vol 89, Num 4, pp 275-290, issn 0304-3991Article

Sub-Ångstrom high-resolution transmission electron microscopy at 300 keVO'KEEFE, M. A; HETHERINGTON, C. J. D; THUST, A et al.Ultramicroscopy. 2001, Vol 89, Num 4, pp 215-241, issn 0304-3991Article

Detection of secondary electrons in a retarding electric fieldSLOWKO, W; DRZAZGA, W.Vacuum. 2001, Vol 63, Num 4, pp 463-467, issn 0042-207XConference Paper

Numerical modelling of mass resolution in a scanning atom probeCEREZO, A; VAUMOUSSE, D.Ultramicroscopy. 2001, Vol 89, Num 1-3, pp 155-161, issn 0304-3991Conference Paper

The effect of mechanical vibration and drift on the reconstruction of exit waves from a through focus series of HREM imagesBOKEL, R. M. J; JANSEN, J; VAN DYCK, D et al.Ultramicroscopy. 1999, Vol 80, Num 4, pp 255-269, issn 0304-3991Article

Complex observation in electron microscopy. I. Basic scheme to surpass the Scherzer limitNAGAYAMA, K.Journal of the Physical Society of Japan. 1999, Vol 68, Num 3, pp 811-822, issn 0031-9015Article

Contrast mechanisms of secondary electron images in scanning electron and ion microscopySAKAI, Y; YAMADA, T; SUZUKI, T et al.Applied surface science. 1999, Vol 144-45, pp 96-100, issn 0169-4332Conference Paper

Field ion microscopy of platinum adatoms deposited on a thin Al₂O₃ film on NiAl(1 1 0)ERNST, N; DUNCOMBE, B; BOZDECH, G et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 231-238, issn 0304-3991Conference Paper

Tunneling in a double-barrier system and its practical implications for field ionization and field emissionKNOR, Z.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 1-10, issn 0304-3991Conference Paper

Design of an objective lens pole piece for a transmission electron microscope with a resolution less than 0.1 nm at 200 kVTSUNO, K; JEFFERSON, D. A.Ultramicroscopy. 1998, Vol 72, Num 1-2, pp 31-39, issn 0304-3991Article

Reflection shadow imaging of crystal surface by low-voltage point-reflection electron microscopyXU ZHANG; WEIERSTALL, U; SPENCE, J. C. H et al.Ultramicroscopy. 1998, Vol 72, Num 1-2, pp 67-81, issn 0304-3991Article

The contrast of images formed by atomic focusersCOWLEY, J. M; DUNIN-BORKOWSKI, R. E; HAYWARD, M et al.Ultramicroscopy. 1998, Vol 72, Num 3-4, pp 223-232, issn 0304-3991Article

Amplification measurements of alternative imaging gases in environmental SEMFLETCHER, A. L; THIEL, B. L; DONALD, A. M et al.Journal of physics. D, Applied physics (Print). 1997, Vol 30, Num 15, pp 2249-2257, issn 0022-3727Article

Some improvements for coincidence electron microscope and observation of coincidence imageYASUNO, M; KIMURA, Y; SHIMIZU, R et al.Optik (Stuttgart). 1997, Vol 106, Num 1, pp 19-27, issn 0030-4026Article

Le point sur la microscopie électronique à balayage = SEM statusGRILLON, F.Spectra 2000 analyse. 1997, Vol 26, Num 197, pp 20-26, issn 1255-2909Article

Study of CO surface diffusion on CO/W(111) by analysis of CO⁺ field ion rate fluctuationsSUCHORSKI, Y; BEBEN, J; MEDVEDEV, V. K et al.Applied surface science. 1996, Vol 94-95, pp 207-211, issn 0169-4332Conference Paper

A carbyne observed in a marketing microgridANDO, Y.Carbon (New York, NY). 1995, Vol 33, Num 2, pp 171-175, issn 0008-6223Article